Facultatea de Fizică
Universitatea "Al.I.Cuza" Iaşi
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| Titlu: Carbon nanowalls analysis using XRF and XPS techniques |
| Autori: I. Burduceaa,b, F. Constantinb, M. Dobromira, C. Ionescub,M. Straticiucb, S. D. Stoicac |
| Afiliere: aDepartment of Physics, Al. I. Cuza University, Iasi , Romania
bHoria Hulubei National Institute of Physics and Nuclear Engineering - IFIN HH Bucharest, Ilfov, Romania
cNational Institute for Laser, Plasma and Radiation Physics Bucharest,Ilfov, Romania |
| Abstract: In this paper it has been investigated the presence of impurities in carbon nanowalls stuctures, due to the deposition
technique. The presence of impurities in these materials may produce dramatic effects on their physical and chemical
properties, improving or most often degradating material's quality. Quantitative measurements in order to determine
impurities concentration or even impurities distribution in our samples are imperative. First a surface analysis was obtained
using Atomic Force Microscopy (AFM) for observing the topology of the nanostructurated carbon. The samples were
analysed using X- Ray Fluorescence (XRF) and X-ray Photoelectron Spectroscopy (XPS) . The results show the presence of
Mo impurities, due to the nozzle used to focus the RF plasma jet . XRF method didn’t allow observation of the Mo spectral
lines because the anticathode of the X ray tube is made of the same element. XPS quantitative measurements were also performed, although they are affected by errors up to 10% because surfaces of the samples hasn’t been cleaned. Further
experiments are planned for a better understanding of how this impurities influences their properties. |
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