Facultatea de Fizică
Universitatea "Al.I.Cuza" Iaşi
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| Titlu: Ellipsometric response of PMMA due to different external factors |
| Autori: P.Tuluc, M. Nica, I. Topala, Nicoleta Dumitrascu |
| Afiliere: Plasma Physics Department, “A. I. Cuza” University, Iasi – 6600, Romania |
| Abstract: Optical techniques are widely used in thin-film analysis and metrology applications. Their inherent simplicity and nondestructiv nature make the optical instruments indispensable to modern research. Among these optical techniques, ellipsometry is one of the most powerful surface-sensitive metrology tools. |
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